HIOKI 9624-50 PQA HiVIEW PRO

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HIOKI 9624-50 PQA HiVIEW PRO

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SPECIFICATIONS
Country of Origin-
Dimension (W x L x H)-
Weight-
Compatible devicesPOWER QUALITY ANALYZER PW3198, 3197, 3196
Supplied mediaCD-R ×1
Operating environmentComputer running under Windows XP/Vista (32-bit), or Windows 7 (32-bit/64bit)
Data loadingPW3198: Saved binary data
3197: Saved binary data
3196: Saved binary data
Screen displaySystem, Time plot, Event list, Event data, Cursor function, Fluctuation graph of event voltage, Graph of event inrush currnet (at only PW3198, 3197), Integrated power, Demand
Copy functionText data, Screen copy to clip-boad
Print functionScreen image, A4/ letter size, preview
CSV convert functionTime plot, Event waveform, Fluctuation of event voltage, Inrush current of event (at only PW3198, 3197), Flicker graph (at only PW3198, 3196), Demand, Integrated power
Report generationAuto output: RMS voltage fluctuation graph, Worst case, Maximum/ minimum value list, Voltage total harmonic distortion percentage graph, All event waveforms, Detailed list of all events, other custom output, or detailed output
Only for the PW3198 and 3196[Screen display] Voltage, Transient waveform, Vector, DMM, Harmonic, Zero-, positive- and negative-phase calculations, Flicker graph, Cursor, High harmonic analysis orders (PW3198)
[Integrated power calculation] Analysis period: 1 - 35 days (PW3198)/ 31 days (3196), Graph, Consumption/ regeneration value, Cursor measurement, Maximum integrated power
[Demand calculation] Demand period: 5 - 30 minutes, 1 - 12 hours, Analysis period: 1 - 35 days (PW3198)/ 31 days (3196), Demand graph of consumption value, Average demand, Peak demand, Load ratio
[ITIC window] Event points are plotted on a tolerance curve (event duration versus swell, dip or interruption voltage percentage), Voltage percentage, Violation count display, Tolerance curve selection
[EN50160 screen] Classification by overview, harmonic, signaling detail (3196) or measurement results
[Data download] Via LAN
[Saving settings] User-defined ITIC curves, Classification settings for measurement results, or other